Toshiba AI Technology Catalog

  • Numerical analysis
  • Causal Inference

Defect factor analysis using Transfer Lasso

Reduces the time and effort required for regular factor analyses, and identifies the essential factors of defects.


  • In periodic analysis of defective factors, utilizing the results of a previous analysis eliminates unnecessary repeated inspections.
  • Reduces the effects of nonessential factor changes (noise)
  • Used in Toshiba’s semiconductor manufacturing facilities.

Applications



  • Defect factor analysis in semiconductor factories
  • Defect factor analysis in other plants

Benchmarks, strengths, and track record



  • Dramatically reduces the time required for detailed investigations of analysis results at semiconductor factories and other plants

Inquiries



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Please note that because this technology is currently the subject of R&D activities, immediate responses to inquiries may not be possible.

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