OPIE '26 (Sensor & Imaging EXPO)
Dates
2026.4.22(Wed) - 4.24(Fri)
10:00am - 5:00pm
Locations
Pacifico Yokohama
Hall A-C, Number:L-26
Exhibition Overview
Toshiba Teli will demonstrate live sample testing using the Surface Flaw Detection Scope at our booth.
This scope incorporates Toshiba’s patented OneShotBRDF™ technology,enabling the detection of surface flaws on flat objects in a single shot.
If you are experiencing difficulties detecting scratches or defects on glossy or flat surfaces, we invite you to bring your samples for on-site evaluation.
Please note that sample testing may be subject to size and condition limitations. Advance arrangements are appreciated.
